micro-and nanofocus X-ray Tubes
In addition to complete GE phoenix|x-ray 2D X-ray inspection and 3D computed tomography systems GE also supplies open X-ray tubes, detectors and image chains for existing or planned X-ray inspection/CT systems. Custom rod anodes are also availalbe for special NDT tasks.
For further information, please contact us: phoenix-info@ge.com
Legend
D microfocus = Directional microfocus
T microfocus = Transmission microfocus
T nanofocus = Transmission nanofocus
D microfocus
With up to 240 kV / 320 W high power, GE's phoenix|x-ray directional microfocus tubes are used in industrial NDT and CT e.g. of light metal castings. Higher tube voltages provide greater measurement accuracy and significantly reduce image artifacts.
| xs|160 d | xs|225 d | xs|240 d | |
|---|---|---|---|
| max. voltage (kV) | 160 | 225 | 240 |
| max. capacity (W) | 320 | 320 | 320 |
| detail detectability | up to 1µm | up to 1µm | up to 1µm |
| target materials | wolfram, copper, molybdenum, more on request | wolfram, copper, molybdenum, more on request | wolfram, copper, molybdenum, more on request |
| rod anode | yes (optional) | yes (optional) | yes (optional) |
| long-life|filament | yes (optional) | yes (optional) | yes (optional) |
| Descriptions | English |
|---|---|
| long-life|filament Datasheet |  |
T microfocus
For X-ray inspection, e.g. of electronic assemblies with detail detectabilities up to to 0.5 microns or CT scans of moulded plastic parts for 3D metrology purposes, GE's phoenix|x-ray transmission type microfocus tubes provide with up to 225 kV / 20 W a significant higher voltage than commonly used 160 kV X-ray tubes.
| xs|160 t | xs|180 t | xs|225 t | |
|---|---|---|---|
| max. voltage (kV) | 160 | 180 | 225 |
| max. capacity (W) | 20 | 20 | 20 |
| detail detectability | up to 0.5µm | up to 0.5µm | up to 0.5µm |
| target materials | wolfram, more on request | wolfram, more on request | wolfram, more on request |
| rod anode | yes (optional) | yes (optional) | yes (optional) |
| diamond|window | yes (optional) | yes (optional) | yes (optional) |
| Descriptions | English |
|---|---|
| diamond|window Datasheet | |
T nanofocus
With its high power nanofocus technology with focal spot sizes well below 1 micron, GE's phoenix|x-ray line has successfully managed to eliminate the residual unsharpness which still occurs at microfocus X-ray tubes. Based on the longest high power nanofocus experience in the industry, GE offers its nanofocus technology providing detail detectabilities down to 200 nanometers for extremely high-resolution inspection of electronic packages or nanoCT® scans in materials science.
| xs|160 hpnf | xs|180 hpnf | ||
|---|---|---|---|
| max. voltage (kV) | 160 | 180 | |
| max. capacity (W) | 15 | 15 | |
| detail detectability | Up to 0.2µm (200nm) | Up to 0.2µm (200nm) | |
| target materials | wolfram, molybdenum, more on request | wolfram, molybdenum, more on request | |
| rod anode | no | no | |
| diamond|window | yes (optional) | yes (optional) |
| Descriptions | English |
|---|---|
| diamond|window Datasheet | |
Rod Anodes
GE offers a large variety of different phoenix|x-ray rod anode types to match a wide range of non destructive microfocus testing tasks, e.g. in turbine or weld seam inspection in pipes. To generate the X-radiation directly inside a difficult-to-access object, the focal spot of the X-ray source is being placed at the end of a rod which is introduced into the work piece. This ensures a high magnification of the inspected details, a significant better resolution and – in case of inspecting samples with two walls like tubes - the advantage that only one wall has to be penetrated by the radiation. There are three major target types for different inspection tasks available:
- panoramic targets are mainly used in X-ray inspection of aircraft turbines
- directional targets are used for weld seam inspection in tubes
- transmission targets are used in tank inspection or difficult-to-access electronic assemblies
In combination with GE's phoenix|x-ray microfocus X-ray tubes, rod anodes ensure high stability and reliability in 2D non destructive X-ray inspection.