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Galaxy XRD Twin Shot

Standard Laue System

The SEIFERT Galaxy XRD Twin Shot is the further development of the Galaxy XRD standard Laue system. The sample is mounted to a motorized X, Y, Z holder assembly. This is positioned automatically to the three points: a. optical camera for point selection and documentation, b. laser adjustment for z­ measurement distance, c. X-ray Laue measurement. The powerful RayfleX software package provides automatic data collection, indexing and evaluation of single crystal orientation referred to the geometric axis of the specimen. For parts with columnar grain growth the relative orientations are calculated. In position a. several points for measurement can be determined and will be automatically adjusted in position b. as well as measured in position c.

 

 

Features

  • Standard W Beam Source
  • Sample adjustment position
  • OpticalCamera for view and documentation
  • Laser z-gauge
  • Motorized X, Y, Z sample mount
  • Flat panel detector 200 x 200 mm2
  • Sample Mapping
  • Standard X-ray protection cabinet
  • Powerful RayfleX software package

Applications

  • Single crystal orientation determination
  • Single crystal specimen
  • Single crystal turbine blades
  • Relative grain orientation

Specifications

Galaxy XRD Twin Shot

Safety cabinet Standard X-ray cabinet according to German X-ray law RöV
X-ray equipment 2 – 60 kV, 2 - 80 mA, max. 3.5 kW, +/- 0.01% at +/-10% mains voltage fluctuation
X-ray tube Tungsten (W) 3000 Watt glass tube point focus
X-ray optics collimator set for different spot sizes
Sample manipulator motorized X, Y, Z sample mount plus x’ axis
Detector real-time flat panel detector 200 x 200 mm2

Sample manipulator

Maximum load: 3 kg
Maximum sample height: 100 mm
Max sample diameter: 100 mm

Z Stage (Vertical Axis)

Minimum step size: 0.001mm
Reproducibility: ± 0.005 mm
Range: 95 mm

X/Y Stage

Minimum step size: 0.001 mm
Reproducibility: ± 0.005 mm
Ranges: 70 mm

X Axis

Minimum step size: 0,1 mm
Range: 400 mm

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