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Accessories

XRD Equipment Accessories

The modular concept of the standard XRD 3003 systems offers many extension possibilities. Beam shaping hardware for primary or secondary beam side and sample handling (movement, positioning) facilities make it -together with the corresponding Rayflex software- a universal XRD system, which covers a wide range of applications.

 

 

 

 

 

 

 

Features

Accessoires for Sample Handling for XRD 3003 Standard Systems:

  • Sample positioning tables with high spatial resolution
  • Sample changer (incl. sample spinner)
  • Capillary mount
  • Environmental chambers for applications at high/low temperature, reactive surroundings or humidity (for PTS- or HR system high temperature only)
  • Texture-Stress-Attachment open Eulerian cradle TSA 3 for XRD 3003 TT
  • Reflectometry attachment with knife edge
  • Oscillation devices

Plug-and-play X-ray Optics for Beam Shaping on Primary Beam side for Bragg-Brentano, Parallel Beam, Focusing Geometry and for Pure Kalpha1-radiation:

  • Special high-flux optics for microdiffraction (min 100 µm spot)
  • Collimators, high-flux optics
  • Parabolic multilayer and/or channel cut monochromator
  • Fully software controlled attenuator for high count rate dynamics
  • 2D-collimating multilayer and double tilt stage (for in-plane GID, GISAXS)

Accessories for Secondary Beam Side:

  • Gracing Incidence Device
  • In-plane GID, GISAXS
  • Channel cut analyser for triple crystal diffraction for PTS-HR
  • Standard scintillation counters, nergy dispersive and high speed detectors

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