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Geology and Exploration

High-resolution CT Systems

High-resolution industrial computed tomography (micro ct and nano ct) is widely used in inspecting geological samples, for example in the exploration for new resources. Special designed industrial CT-systems provide three-dimensional images at microscopic resolution of rock samples, binders, cements and cavities and help identify certain sample characteristics such as size and location of voids in oil-bearing rock.

 

 

 

 

 

 

 

Gallery

geology-exploration-salt-tn

nanoCT® of a compacted sample of salt used for landfilling purposes (tomographic layer). Both distribution and density are visualized three-dimensionally.

(Images courtesy of the Geoscience Center, Goettingen University)

geology-exploration-pillow-basalt-tn

Three-dimensional image of a sample of pillow basalt (pillow lava). Virtual cross-sectional images in any direction by mouse-click allow exploring the sample microstructure.

(Images courtesy of the Geoscience Center, Goettingen University)

geology-exploration-pillow-basalt-2-tn

3D-image of the same pillow basalt sample as above. The rock itself was faded out to better visualize the void structure, the size and volume of which can now be measured.

(Images courtesy of the Geoscience Center, Goettingen University)

geology-exploration-biogenic-methane-lime-tn

nanoCT® of a sample of biogenic methane-lime. The rock was faded out to better visualize the void structure. The voxel resolution of 2 µm enables the analysis of even the finest interior structures.

(Images courtesy of the Geoscience Center, Goettingen University)

Products

nanotomv|tome|x s
link-nanotom-ct-system link-vtomex-s-industrial-ct-system
Max. resolution (depending on object size) <0,5µ (3D) 4µ (3D)
Max. object size (height x diameter) 6" x 5" app. 12" x 10"
Max. object weight 2 kg/ 4.40 lb 10 kg/ 22.03 lb
2 X- ray sources no yes (optional)
2D X-ray imaging no yes
CAD comparison + dimensional measurement yes (optional) yes (optional)
Max. tube voltage 180kV 240kV
Automated pore analysis yes (optional) yes (optional)