GE Inspection Technologies launches Phasor XS, its first portable, Phased Array instrument with imaging features Phasor XS is GE’s first accessible Phased Array solution offering portability, inspection efficiency and higher probability of detection at a reduced cost

Lewistown, PA, USA – April, 2006.

Today, GE Inspection Technologies introduced Phasor XS, its first portable phased array product with imaging features.  The instrument, designed to inspect welds on a wide variety of applications, will be unveiled at the Aerospace Testing Expo in Hamburg, Germany, April 4-6, 2006.

Phasor XS provides an integrated multiple beam inspection solution to each of GE Inspection Technologies’ target market segments: Aerospace, Automotive, Oil & Gas and Power Generation.   The instrument is the result of GE’s significant investment to create a Phased Array inspection solution that supplies higher quality testing for the end user and the ability to share results in real-time.

Phasor XS is an extension of GE’s flaw detection product line.  Its Phased Array imaging offers an integrated cross sectional visualization through multiple beams of different angles, or, multiple shots of the same angle. There is no need to change the probe. Phasor XS also has a single conventional ultrasonic channel, allowing traditional flaw detection inspection with a conventional, single element probe.

With Phasor XS, electronic control of the beam allows test procedures to be developed that will yield higher probability of detection in the same inspection time, by allowing the choice of an ideal beam over a larger area. The Phasor XS also offers the advantage of a full-color, real time sector display with a selectable A-Scan for instant and accurate evaluation.  

Phasor XS is an ideal entry-level Phased Array inspection solution.  It is easy-to-use and offers the same high-quality inspections with less complexity at a lower cost.  The instrument is portable, battery-powered and weighs just seven pounds.