Metrology Equipments Overview
Computed tomography offers considerable advantages over conventional optical or tactile Coordinate Measuring Machines especially when measuring complex parts with hidden surface or features which are difficult to access. Our metrology equipment consist computed tomography systems for high precision 3D metrology of the complete internal and external geometry of the object.
v|tome|x L 300
The phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W.
Fast and accurate 450 kV CT system for inspection of complex multi-wall turbine blades
phoenix nanotom m
nanoCT® system for scientific and industrial computed tomography (micro ct and nano ct) and 3D metrology on a wide sample range.
phoenix nanotom s
First 180 kV / 15 W nanofocus computed tomography (nano ct) system designed for material science and precision injection moulding.
High-resolution system for 2D X-ray inspection and 3D computed tomography (micro ct and nano ct)) as well as for 3D metrology.
v|tome|x L 240
High-resolution microfocus computed tomography (micro ct) system for 3D computed tomography.
v|tome|x L 450
High-resolution microfocus system for 2D and 3D computed tomography (micro ct) and 2D non-destructive X-ray inspection.